Analysis of Factors Affecting the Pixel Performance of CMOS Image Sensors

Hao Xu

doi:10.6919/ICJE.202511_11(11).0002

Authors

Hao Xu

DOI:

https://doi.org/10.6919/ICJE.202511_11(11).0002

Keywords:

CIS; Temperature; Radiation; Pixel Structure; Manufacturing Process; Analysis and Summary.

Abstract

A CMOS image sensor is a semiconductor device that converts optical signals into electrical signals. It is widely used in various fields such as digital cameras, smartphones, security surveillance, medical imaging, and automotive electronics, serving as the core component of modern imaging technology. The surface of the sensor is composed of an array of millions of tiny photo sensitive units (pixels). Each pixel contains a photodiode and several transistors. This paper investigates the pixel performance of CMOS image sensors, analyzes the factors that affect pixel performance, and summarizes potential improvement methods.

Downloads

Download data is not yet available.

References

[1] Lin Y. (2005) CIS Tending to Replace CCD. Electronic Technology, (09): 15-18.

[2] Simon M. Sze & Kwok K. Ng (2006) Physics of Semiconductor Devices (3rd ed.). Xi'an Jiaotong University Press, Wiley.

[3] Chen J., Guo J., Zhong X., Gu X., Yu Z. (2025) Research Progress on Noise Suppression for CIS. Electronics & Packaging, 25(06): 84-96.

[4] Joseph, D. and Collins, S. (2009) "Temperature Dependence of Fixed Pattern Noise in Logarithmic CMOS Image Sensors," in IEEE Transactions on Instrumentation and Measurement, 58(8): 2503-2511.

[5] Zheng R., Liu C., Liu H., Hui X. (2018) Prediction Method for Dark Current Amplitude Distribution of CMOS Image Sensors in Radiation Environment. Microelectronics & Computer, 35(04): 144-148.

[6] Peng Z., Bai H., Liu F., et al. (2025) Influence of Proton Cumulative Irradiation Effects on CIS Saturation Output. Acta Physica Sinica, 74(02): 102-113.

[7] Mao Z. (2022) Research on CIS Imaging Performance Testing Technology. University of Chinese Academy of Sciences (Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences).

[8] Chen J., Guo J., Zhong X., Gu X., Yu Z. (2025) Research Progress on Noise Suppression for CMOS Image Sensors. Electronics and Packaging, 25(06): 84-96.