Planar and Incident Angle-insensitive Hot-electron Photodetection with Tamm Plasmons

Xiaoyan Yang

doi:10.6919/ICJE.202508_11(8).0008

Authors

Xiaoyan Yang

DOI:

https://doi.org/10.6919/ICJE.202508_11(8).0008

Keywords:

Hot Electron; Tamm Plasmons; Photodetection; Incident Angle; Resonance Wavelength.

Abstract

Unlike nanostructured hot-electron photodetectors (HE PDs), planar counterpart is attracting increasing attention due to the advantages of the cost-effective fabrication and large-scale application. However, the working wavelengths of most HE PDs are closely related to the incident angles. Herein, it is demonstrated a planar HE PD based on Tamm plasmons whose excitation wavelength is insensitive to the incident angle under transverse-electric incidence. Detailed studies show that high refractive index of Ge is responsible for the relatively stable working wavelength when incident angle is variable.

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