Research on Precise Analysis and Location of Server Memory Faults

Authors

  • Xin Zhang

DOI:

https://doi.org/10.6919/ICJE.202603_12(3).0024

Keywords:

Server Memory; Fault Analysis; Precise Location; Fault Diagnosis.

Abstract

Current server memory fault diagnosis suffers from low efficiency, insufficient location accuracy, and high misclassification rate, making it difficult to meet the high reliability requirements of high-density computing and big data processing scenarios. This paper sorts out the core types and inducing factors of server memory faults, constructs a multi-dimensional fault analysis index system, embeds a table corresponding to fault characteristics and location methods, and explores the precise fault analysis process and key points of location technology, providing theoretical reference and practical guidance for improving the efficiency and accuracy of server memory fault diagnosis and reducing operational risks.

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References

[1] Kevin K. Chang, Abhijith Kashyap, Hasan Hassan, et al. Understanding Latency Variation in Modern DRAM Chips[J]. ACM SIGMETRICS Performance Evaluation Review, 2016, 44(1): 323-336.

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[3] Donghyuk Lee, Samira Khan, Lavanya Subramanian, et al. Design-Induced Latency Variation in Modern DRAM Chips[J]. Proceedings of the ACM on Measurement and Analysis of Computing Systems, 2017, 1(1): 1-36.

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Published

2026-03-19

Issue

Section

Articles

How to Cite

Zhang, X. (2026). Research on Precise Analysis and Location of Server Memory Faults. International Core Journal of Engineering, 12(3), 213-217. https://doi.org/10.6919/ICJE.202603_12(3).0024