ZHU, Ye. Dice-Tversky-Based Instance Segmentation of Small Defects in Automotive Sealing Strips. International Core Journal of Engineering, [S. l.], v. 12, n. 9, p. 285–290, 2026. DOI: 10.6919/ICJE.202609_12(9).0030. Disponível em: https://icj-e.org/index.php/ojs/article/view/467. Acesso em: 20 oct. 2026.